IEEE 1293: Standard for Terminology and Test Methods for Circuit Probes
IEEE 1293 is officially titled:“IEEE Standard for Terminology and Test Methods for Circuit Probes.” It defines standardised terms, classifications, and testing procedures related to circuit probes, especially spring-loaded or pogo pin types used in test fixtures. These probes make temporary connections between electronic test systems and the devices under test (DUTs), typically in in-circuit testing […]
IEEE 1293: Standard for Terminology and Test Methods for Circuit Probes Read More »